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1 | C:\AraxisMergeCompare\Pri_un\EPIP combined\MD_1.0_57 | EPIP_Test_Evaluation_(MD_1.0_57).doc | Tue Feb 12 17:13:48 2019 UTC |
2 | C:\AraxisMergeCompare\Pri_re\EPIP combined\MD_1.0_57 | EPIP_Test_Evaluation_(MD_1.0_57).doc | Tue Feb 12 18:32:06 2019 UTC |
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1 | Test Evalu ationExist ing Produc t Intake P rogram (EP IP) | |
2 | Patch MD*1 .0*57 | |
3 | Test Evalu ation | |
4 | ||
5 | Department of Vetera ns Affairs | |
6 | February 2 019 | |
7 | Version 1. 0 | |
8 | Revision H istory | |
9 | Note: The revision h istory cyc le begins once chang es or enha ncements a re request ed after t he Communi cations Pl an has bee n baseline d. | |
10 | DateVersio nDescripti onAuthor02 /04/20191. 0Initial d ocumentEPI P Project TeamArtifa ct Rationa le | |
11 | The test e valuation document i s the prim ary output of the te st and eva luation pr ocess, an integral p art of the systems e ngineering process, which iden tifies lev els of per formance a nd assists the devel oper in co rrecting d eficiencie s. | |
12 | Table of C ontents | |
13 | 11. | |
14 | Test Evalu ation Intr oduction | |
15 | ||
16 | ||
17 | 11.1. | |
18 | Test Evalu ation Scop e | |
19 | ||
20 | ||
21 | 11.2. | |
22 | Test Archi tecture | |
23 | ||
24 | ||
25 | 11.3. | |
26 | Test Envir onment/Con figuration | |
27 | ||
28 | ||
29 | 21.4. | |
30 | Installati on Process | |
31 | ||
32 | ||
33 | 22. | |
34 | Test Data | |
35 | ||
36 | ||
37 | 23. | |
38 | Issues | |
39 | ||
40 | ||
41 | 24. | |
42 | Test Execu tion Log | |
43 | ||
44 | ||
45 | 35. | |
46 | Test Defec t Log | |
47 | ||
48 | ||
49 | 36. | |
50 | Test Resul ts Summary | |
51 | ||
52 | ||
53 | 36.1. | |
54 | Defect Sev erity and Priority L evels | |
55 | ||
56 | ||
57 | 36.2. | |
58 | Total Defe cts by Sev erity Leve l | |
59 | ||
60 | ||
61 | 36.3. | |
62 | Breakdown of Test Re sults | |
63 | ||
64 | ||
65 | 36.4. | |
66 | Performanc e Testing | |
67 | ||
68 | ||
69 | 37. | |
70 | Test Cover age | |
71 | ||
72 | ||
73 | 37.1. | |
74 | Requiremen ts Covered | |
75 | ||
76 | ||
77 | 47.2. | |
78 | Section 50 8 Complian ce Coverag e | |
79 | ||
80 | ||
81 | 48. | |
82 | Suggested Actions | |
83 | ||
84 | ||
85 | 49. | |
86 | Defect Sev erity and Priority D efinitions | |
87 | ||
88 | ||
89 | 59.1. | |
90 | Defect Sev erity Leve l | |
91 | ||
92 | ||
93 | 59.1.1. | |
94 | Severity L evel 1 – C ritical | |
95 | ||
96 | ||
97 | 59.1.2. | |
98 | Severity L evel 2 - H igh | |
99 | ||
100 | ||
101 | 59.1.3. | |
102 | Severity L evel 3 - M edium | |
103 | ||
104 | ||
105 | 69.1.4. | |
106 | Severity L evel 4 - L ow | |
107 | ||
108 | ||
109 | 69.2. | |
110 | Priority C lassificat ions | |
111 | ||
112 | ||
113 | 69.2.1. | |
114 | Priority 1 - Resolve Immediate ly | |
115 | ||
116 | ||
117 | 69.2.2. | |
118 | Priority 2 - Give Hi gh Attenti on | |
119 | ||
120 | ||
121 | 69.2.3. | |
122 | Priority 3 - Normal Queue | |
123 | ||
124 | ||
125 | 69.2.4. | |
126 | Priority 4 - Low Pri ority | |
127 | ||
128 | ||
129 | 610. | |
130 | Optional T ables, Cha rts, and G raphs | |
131 | ||
132 | ||
133 | 711. | |
134 | Document A pproval Si gnatures | |
135 | ||
136 | ||
137 | 8Appendix A - Test E xecution L og | |
138 | ||
139 | ||
140 | 9Appendix B – Defect Log | |
141 | ||
142 | ||
143 | ||
144 | ||
145 | Test Evalu ation Intr oduction | |
146 | The purpos e of this Test Evalu ation is t o: | |
147 | Identify t he testing approach used. | |
148 | Present a summary an alysis of the key te st results from the remediatio n of this intake for review an d assessme nt by desi gnated sta keholders. | |
149 | Provide a general st atement of the quali ty of the system und er test. | |
150 | Make recom mendations for futur e testing efforts. | |
151 | Test Evalu ation Scop e | |
152 | The scope of this Te st Evaluat ion is to verify the functiona lity of th e Patch MD *1.0*57 co de modific ation, as determined by Functi onal, Comp onent Inte gration/Sy stem, and Regression testing. Testing ac tivities f ollowed th e specific ations out lined in t he followi ng Master Test Plan: MD*1.0*57 Master Te st Plan (i ncluded in Appendix A). | |
153 | Test Archi tecture | |
154 | Following are the EP IP test ac counts use d by the L eidos Deve lopment an d SQA Test ing teams to test MD *1.0*57. | |
155 | Developmen t Test Acc ounts | |
156 | (For Unit Testing)SQ A Test Acc ounts | |
157 | (For Funct ional, Reg ression, a nd Compone nt Integra tion and S ystem Test ing)VistAS 1 (alterna te name: D 1S1)VistAG 1 (alterna te name: D 1G1) VistA S2 (altern ate name: D1S2) – | |
158 | for CPRS G UI testing onlyVistA G2 (altern ate name: D1G2) – | |
159 | for CPRS G UI testing onlyTest Environmen t/Configur ation | |
160 | The EPIP t est accoun ts are mai ntained by the EPIP System Adm inistrator , who inst alls all V A-released patches a s soon as they are n ationally released. All EPIP t est accoun ts are clo ned from e xisting VA Enterpris e Testing Services ( ETS) test accounts. The Comput erized Pat ient Recor d System ( CPRS) Grap hical User Interface (GUI) exe cutable is configure d for each VistA ins tance util izing a un ique Inter net Protoc ol (IP) ad dress to c onnect to the VistA applicatio ns. Any up dates to t he CPRS GU I executab le are han dled by th e EPIP Sys tem Admini strator. | |
161 | All EPIP T est Engine ers and De velopers w ho have th e proper c redentials can acces s the test accounts. The VA Au stin Infor mation Tec hnology Ce nter (AITC ) support team reset s password s and sets up new ac cess crede ntials on an as-need ed basis. | |
162 | Installati on Process | |
163 | As soon as the remed iation pro cess is co mplete and the patch is availa ble for te sting, a K IDS build is created in the De velopment account an d then sen t to FORUM for final packaging . The patc h is then submitted to the VA SQA Lead’s Mailman a ccount for installat ion. | |
164 | An EPIP De veloper or Test Engi neer utili zes the KI DS Install ation proc ess to ext ract the b uild from the patch and instal l the buil d into a t est accoun t. The ind ividual wh o installs the patch verifies the routin e checksum s and also checks fo r errors d uring the installati on process . If the p atch is su ccessfully installed without a ny errors, then the EPIP Test team proce eds with F unctional, Regressio n, and Com ponent Int egration a nd System testing. I f defects are found, then the Developmen t team wor ks to find a resolut ion and cr eates new versions o f the patc h until al l defects are resolv ed. | |
165 | Test Data | |
166 | The SQA Te sting team utilizes the test d ata in the designate d test acc ounts (D1G 1, D1G2). | |
167 | The test d ata is enc rypted fol lowing the standards set forth by the VA Office of Informati on & Techn ology (OIT ). All Per sonally Id entifiable Informati on (PII) a nd Protect ed Health Informatio n (PHI) is scrubbed and is not available to the Te st Enginee rs. | |
168 | All testin g is execu ted using encrypted test patie nts availa ble from a ny of the EPIP test accounts. Examples o f encrypte d test pat ients: | |
169 | AAAHURMMX, XPHY | |
170 | BADHB, HAA DXS | |
171 | FDHUX, YHI J | |
172 | All tests were execu ted manual ly by EPIP Test Engi neers. | |
173 | Issues | |
174 | No issues were encou ntered dur ing testin g of MD*1. 0*57. | |
175 | TitleIssue Descripti onTypeSeve rityN/AN/A N/AN/ATest Execution Log | |
176 | The Test E xecution L og records the execu tion of te st scripts and docum ents the t est result s for each test scri pt. | |
177 | The SQA Te sting team utilizes the Ration al Quality Managemen t (QM) too l for all testing ac tivities. All test d ocuments a re stored in the EPI P reposito ry, includ ing the Ma ster Test Plan, Test Suites, T est Cases, and Test Scripts. T est execut ion is per formed, an d test res ults recor ded, in Ra tional QM. The Test Engineer a dds the te st results to the Te st Executi on records to indica te whether testing a chieved Pa ss or Fail status. | |
178 | The Test E xecution r ecords for MD*1.0*57 are inclu ded in the EPIP Patc h MD*1.0*5 7 Master T est Plan. The Master Test Plan is availa ble in App endix A. | |
179 | Test Defec t Log | |
180 | The Test D efect Log is a tool for record ing, analy zing, trac king, and documentin g the clos ure of def ects. It s pecifies t he screen, field, be havior or result tha t occurred , and the IEEE-defin ed Severit y Level. I t includes enough in formation for the de veloper to find and re-create the defect . The Defe ct Log is available in Appendi x B. | |
181 | Test Resul ts Summary | |
182 | SQA testin g for this intake st arted in t he Dev1 Go ld1 test e nvironment on Januar y 20, 2019 and ended on Februa ry 4, 2019 . Test ver sion 1 was installed in the te st environ ment after Unit test ing in Dev 1 Silver1 was comple ted. Upon completion of Integr ation test ing (Compo nent Integ ration and System Te sting, Fun ctional Te sting, and Regressio n Testing) , zero (0) defects w ere found and report ed. | |
183 | Defect Sev erity and Priority L evels | |
184 | A defect i s defined as a flaw in a compo nent or sy stem that can cause the compon ent or sys tem to fai l to perfo rm its req uired func tion, e.g. , an incor rect state ment or da ta definit ion. A def ect, if en countered during exe cution, ma y cause a failure of the compo nent or sy stem. | |
185 | Defects ar e categori zed accord ing to sev erity and priority l evels. The test anal yst assign s the seve rity, whil e the deve lopment ma nager assi gns the pr iority for repair. F or more in formation, see Defec t Severity and Prior ity Defini tion in th is Test Ev aluation. | |
186 | Total Defe cts by Sev erity Leve l | |
187 | The Defect Log in Ap pendix B d isplays th e defects encountere d while te sting this patch, an d the seve rity level of each. | |
188 | Breakdown of Test Re sults | |
189 | Testing wa s complete d on Febru ary 4, 201 9. All tes t results were recor ded in Rat ional QM. Detailed r esults are available in the EP IP Patch M D*1.0*57 M aster Test Plan (see Appendix A). | |
190 | Performanc e Testing | |
191 | Performanc e testing was not co nducted. | |
192 | Test Cover age | |
193 | The EPIP P atch MD*1. 0*57 Maste r Test Pla n contains details o n test cov erage (see Appendix A). | |
194 | Requiremen ts Covered | |
195 | The requir ements for MD*1.0*57 are store d in the R ational Re quirements Managemen t (RM) app lication. The test c ases store d in Ratio nal Qualit y Manageme nt (QM) ar e used to validate t hat the re quirements have been addressed , providin g full tra ceability. The user stories st ored in Ra tional Con figuration Managemen t (CM) are linked to the requi rements in RM and te st cases i n QM. | |
196 | The follow ing links provide ac cess to th e various Clinical P rocedures (CP) repos itories in the Ratio nal toolki t. If link translati on issues prevent di rect acces s, copy an d paste th e URLs int o your bro wser. | |
197 | CP (RM) – Go to Arti facts. Loc ate the EP IP folder on the lef t side of the page a nd expand it to disp lay patch folders. E ach patch folder con tains the requiremen ts for the patch num ber shown in the fol der name. | |
198 | https:// URL /rm/web#ac tion=com.i bm.rdm.web .pages.sho wFoundatio nProjectDa shboard&co mponentURI =https:// URL /rm/rm-pro jects/_dHc AEio0EeWKc sR0IvSE7w/ components /_CYLcgNIX EeWADNdRzg PDKQ | |
199 | CP (QM) – Go to Plan ning, then Browse Te st Plans, and then s earch for the Master Test Plan you need. The Maste r Test Pla n and test cases are linked to requireme nts. | |
200 | https:// URL /qm/web/co nsole/CP%2 0(QM)#acti on=com.ibm .rqm.plann ing.home.a ctionDispa tcher&subA ction=view UserHome | |
201 | CP (CM) – Go to Plan s, then Al l Plans, a nd then se arch for t he Sprint Plan you n eed. The u ser storie s in each Plan are l inked to r equirement s and test cases. | |
202 | https:// URL /ccm/web/p rojects/CP %20(CM)#ac tion=com.i bm.team.da shboard.vi ewDashboar d | |
203 | Section 50 8 Complian ce Coverag e | |
204 | Section 50 8 test res ults will be reporte d to VA in the follo wing docum ents: | |
205 | EPIP_VASec tion508_Co mpliance_T est_Result s_(MD*1.0* 57) | |
206 | EPIP_VASec tion508_In take_Docum ent_(MD*1. 0*57) | |
207 | EPIP_VASec tion508_Ve rifiable_O bjective_E vidence_(M D*1.0*57) | |
208 | Suggested Actions | |
209 | Leidos rec ommends mo ving this patch to I OC testing . | |
210 | Defect Sev erity and Priority D efinitions | |
211 | The classi fication o f defects within a s ystem exam ines both the severi ty and pri ority of t he defect. | |
212 | Severity i s a measur e of how g reat the i mpact is o n the user ’s ability to comple te the doc umented ac tions with in the sys tem. | |
213 | Priority d etermines the speed with which a given d efect must be repair ed. | |
214 | Defect cla ssificatio n may be d etermined either bec ause testi ng is dela yed by a f ailure in the system or becaus e a cumber some worka round prev ents a use r from com pleting th e assigned tasks. Bo th severit y and prio rity measu res must b e recorded when sche duling def ect resolu tion tasks . | |
215 | Defect Sev erity Leve l | |
216 | The follow ing subsec tions iden tify the d efect seve rity level s. | |
217 | Severity L evel 1 – C ritical | |
218 | Institute of Electri cal and El ectronics Engineers (IEEE) def inition: T he defect results in the failu re of the complete s oftware sy stem, of a subsystem , or of a software u nit (progr am or modu le) within the syste m. | |
219 | Any defect that comp romises pa tient safe ty or syst em securit y. Example s of syste m security defects i nclude bre ach of con fidentiali ty require ments of t he Privacy Act, the Health Ins urance Por tability a nd Account ability Ac t (HIPAA), or Federa l Tax Info rmation gu idelines. | |
220 | Loss of sy stem funct ionality c ritical to user oper ations wit h no suita ble workar ound, i.e. , there is no way to achieve t he expecte d results using the applicatio n. | |
221 | System cra sh or hang that prev ents furth er testing or operat ion of the complete applicatio n or a sec tion of th e applicat ion. | |
222 | Any defect that caus es corrupt ion of dat a from a r esult of t he system (as oppose d to user error). | |
223 | Any defect in which inappropri ate transm issions ar e consiste ntly gener ated or ap propriate transmissi ons of HL7 messages fail to be generated . | |
224 | Loss of fu nctionalit y resultin g in erron eous eligi bility/enr ollment de terminatio ns or comm unications not being sent. | |
225 | Severity L evel 2 - H igh | |
226 | IEEE defin ition: The defect re sults in t he failure of the co mplete sof tware syst em, of a s ubsystem, or of a so ftware uni t (program or module ) within t he system. There is no way to make the f ailed comp onent(s) f unction. H owever, th ere are ac ceptable p rocessing alternativ es which w ill yield the desire d result. | |
227 | A major de fect in th e function ality that does not result in corruption of data. | |
228 | A major de fect in th e function ality resu lting in a failure o f all or p art of the applicati on, where: | |
229 | The expect ed results can tempo rarily be achieved b y alternat e means. T he custome r indicate s the work around is acceptabl e for the short term . | |
230 | Any defect that does not confo rm to Sect ion 508 st andards. | |
231 | Any defect that resu lts in ina ccurate or missing r equirement s. | |
232 | Any defect that resu lts in inv alid authe ntication or authent ication of an invali d end user . | |
233 | Severity L evel 3 - M edium | |
234 | IEEE defin ition: The defect do es not res ult in a f ailure, bu t causes t he system to produce incorrect , incomple te, or inc onsistent results, o r the defe ct impairs the syste ms usabili ty. | |
235 | Minor func tionality is not wor king as in tended and a workaro und exists but is no t suitable for long term use | |
236 | The inabil ity of a v alid user to access the system consisten t with gra nted privi leges | |
237 | Typographi cal or gra mmatical e rrors in t he applica tion, incl uding inst allation g uides, use r guides, training m anuals, an d design d ocuments | |
238 | Any defect producing cryptic, incorrect, or inappr opriate er ror messag es | |
239 | Any defect that resu lts from t he use of non-standa rd data te rminology in the app lication o r document ation, as defined by the Depar tment of V eterans Af fairs | |
240 | Cosmetic i ssues that are impor tant to th e integrit y of the p roduct, bu t do not r esult in d ata entry and or dat a quality problems. | |
241 | Severity L evel 4 - L ow | |
242 | IEEE defin ition: The defect do es not cau se a failu re, does n ot impair usability, and the d esired pro cessing re sults are easily obt ained by w orking aro und the de fect. | |
243 | Minor loss of, or de fect in th e function ality wher e a long t erm use ex ists | |
244 | Low-level cosmetic i ssues. | |
245 | Priority C lassificat ions | |
246 | The follow ing subsec tions iden tify the a ppropriate actions f or defects at each p riority le vel, per d efinitions of IEEE. | |
247 | Priority 1 - Resolve Immediate ly | |
248 | Further de velopment and/or tes ting canno t occur un til the de fect has b een repair ed. The sy stem canno t be used until the repair has been affe cted. | |
249 | Priority 2 - Give Hi gh Attenti on | |
250 | The defect must be r esolved as soon as p ossible be cause it i s impairin g developm ent and/or testing a ctivities. System us e will be severely a ffected un til the de fect is fi xed. | |
251 | Priority 3 - Normal Queue | |
252 | The defect should be resolved in the nor mal course of develo pment acti vities. It can wait until a ne w build or version i s created. | |
253 | Priority 4 - Low Pri ority | |
254 | The defect is an irr itant that should be repaired, but can b e repaired after mor e serious defects ha ve been fi xed. | |
255 | Optional T ables, Cha rts, and G raphs | |
256 | None. | |
257 | Document A pproval Si gnatures | |
258 | Signed: __ __________ __________ __________ __________ __________ __________ _________ | |
259 | Program/Pr oject Mana ger | |
260 | Date | |
261 | Signed: __ __________ __________ __________ __________ __________ __________ _________ | |
262 | Business S ponsor Rep resentativ e | |
263 | Date | |
264 | Signed: __ __________ __________ __________ __________ __________ __________ _________ | |
265 | Test Lead | |
266 | Date | |
267 | Appendix A - Test Ex ecution Lo g | |
268 | The Test E xecution R ecords for MD*1.0*57 are inclu ded in the EPIP Patc h MD*1.0*5 7 Master T est Plan. | |
269 | ||
270 | Appendix B – Defect Log | |
271 | No defects were foun d during t esting of MD*1.0*57. | |
272 | Defect IDA ffected Sc reenAffect ed FieldOb served Beh aviorSever ityDescrip tionN/AN/A N/AN/AN/AN o defects were found during Un it Testing of versio n 1.0.N/AN /AN/AN/AN/ ANo defect s were fou nd during Component Integratio n/Systems Testing of version 1 .0.N/AN/AN /AN/AN/ANo defects w ere found during Reg ression te sting of v ersion 1.0 .N/AN/AN/A N/AN/ANo d efects wer e found du ring Funct ional Test ing of ver sion 1.0. | |
273 | _161147517 1.pdf |
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