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| 1 | EPIP_submissions.zip\EPIP_submissions\docs\GMRC_3.0_89 | EPIP_Test_Evaluation_(GMRC_3.0_89).docx | Fri Mar 31 16:50:12 2017 UTC |
| 2 | EPIP_submissions.zip\EPIP_submissions\docs\GMRC_3.0_89 | EPIP_Test_Evaluation_(GMRC_3.0_89).docx | Fri Mar 31 17:47:48 2017 UTC |
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| 1 | Existing P roduct Int ake Progra m (EPIP) | ||
| 2 | Patch GMRC *3.0*89 | ||
| 3 | Test Evalu ation | ||
| 4 | |||
| 5 | |||
| 6 | |||
| 7 | Department of Vetera ns Affairs | ||
| 8 | March 2017 | ||
| 9 | Version 1. 0 | ||
| 10 | |||
| 11 | |||
| 12 | |||
| 13 | Revision H istory | ||
| 14 | Note: The revision h istory cyc le begins once chang es or enha ncements a re request ed after t he Communi cations Pl an has bee n baseline d. | ||
| 15 | Date | ||
| 16 | Version | ||
| 17 | Descriptio n | ||
| 18 | Author | ||
| 19 | 03/21/2017 | ||
| 20 | 1.0 | ||
| 21 | Initial do cument. | ||
| 22 | EPIP Proje ct Team | ||
| 23 | |||
| 24 | Artifact R ationale | ||
| 25 | The test e valuation document i s the prim ary output of the te st and eva luation pr ocess, an integral p art of the systems e ngineering process, which iden tifies lev els of per formance a nd assists the devel oper in co rrecting d eficiencie s. | ||
| 26 | Table of C ontents | ||
| 27 | 1.Test Eva luation In troduction 1 | ||
| 28 | 1.1.Test E valuation Scope1 | ||
| 29 | 1.2.Test A rchitectur e1 | ||
| 30 | 1.3.Test E nvironment /Configura tion1 | ||
| 31 | 1.4.Instal lation Pro cess2 | ||
| 32 | 2.Test Dat a2 | ||
| 33 | 3.Issues2 | ||
| 34 | 4.Test Exe cution Log 2 | ||
| 35 | 5.Test Def ect Log3 | ||
| 36 | 6.Test Res ults Summa ry3 | ||
| 37 | 6.1.Defect Severity and Priori ty Levels3 | ||
| 38 | 6.2.Total Defects by Severity Level4 | ||
| 39 | 6.3.Breakd own of Tes t Results4 | ||
| 40 | 6.4.Perfor mance Test ing4 | ||
| 41 | 7.Test Cov erage4 | ||
| 42 | 7.1.Requir ements Cov ered4 | ||
| 43 | 7.2.Sectio n 508 Comp liance Cov erage4 | ||
| 44 | 8.Suggeste d Actions5 | ||
| 45 | 9.Defect S everity an d Priority Definitio ns5 | ||
| 46 | 9.1.Defect Severity Level5 | ||
| 47 | 9.1.1.Seve rity Level 1 – Criti cal5 | ||
| 48 | 9.1.2.Seve rity Level 2 - High5 | ||
| 49 | 9.1.3.Seve rity Level 3 - Mediu m6 | ||
| 50 | 9.1.4.Seve rity Level 4 - Low6 | ||
| 51 | 9.2.Priori ty Classif ications6 | ||
| 52 | 9.2.1.Prio rity 1 - R esolve Imm ediately6 | ||
| 53 | 9.2.2.Prio rity 2 - G ive High A ttention7 | ||
| 54 | 9.2.3.Prio rity 3 - N ormal Queu e7 | ||
| 55 | 9.2.4.Prio rity 4 - L ow Priorit y7 | ||
| 56 | 10.Optiona l Tables, Charts, an d Graphs7 | ||
| 57 | 11.Documen t Approval Signature s8 | ||
| 58 | Appendix A - Test Ex ecution Lo g9 | ||
| 59 | Appendix B – Defect Log10 | ||
| 60 | |||
| 61 | Test Evalu ation Intr oduction | ||
| 62 | The purpos e of this Test Evalu ation is t o: | ||
| 63 | Identify t he testing approach used. | ||
| 64 | Present a summary an alysis of the key te st results from the remediatio n of this intake for review an d assessme nt by desi gnated sta keholders. | ||
| 65 | Provide a general st atement of the quali ty of the system und er test. | ||
| 66 | Make recom mendations for futur e testing efforts. | ||
| 67 | Test Evalu ation Scop e | ||
| 68 | The scope of this Te st Evaluat ion is to verify the functiona lity of th e Patch GM RC*3.0*89 code modif ication, a s determin ed by Func tional, Co mponent In tegration/ System, an d Regressi on testing . Testing activities followed the specif ications o utlined in the follo wing Maste r Test Pla n: GMRC*3. 0*89 Maste r Test Pla n (include d in Appen dix A). | ||
| 69 | Test Archi tecture | ||
| 70 | Following are the EP IP test ac counts use d by the L eidos Deve lopment an d SQA Test ing teams to test GM RC*3.0*89. | ||
| 71 | Developmen t Test Acc ounts | ||
| 72 | (For Unit Testing) | ||
| 73 | SQA Test A ccounts | ||
| 74 | (For Funct ional, Reg ression, a nd Compone nt Integra tion and S ystem Test ing) | ||
| 75 | VistAS1 ( alternate name: D1S1 ) | ||
| 76 | VistAG1 (a lternate n ame: D1G1) | ||
| 77 | VistAS2 (a lternate n ame: D1S2) –for CPRS GUI testi ng only | ||
| 78 | VistAG2 (a lternate n ame: D1G2) –for CPRS GUI testi ng only | ||
| 79 | Test Envir onment/Con figuration | ||
| 80 | The EPIP t est accoun ts are mai ntained by the EPIP System Adm inistrator , who inst alls all V A-released patches a s soon as they are n ationally released. All EPIP t est accoun ts are clo ned from e xisting VA Enterpris e Testing Services ( ETS) test accounts. The Comput erized Pat ient Recor d System ( CPRS) Grap hical User Interface (GUI) exe cutable is configure d for each VistA ins tance util izing a un ique Inter net Protoc ol (IP) ad dress to c onnect to the VistA applicatio ns. Any up dates to t he CPRS GU I executab le are han dled by th e EPIP Sys tem Admini strator. | ||
| 81 | All EPIP T est Engine ers and De velopers w ho have th e proper c redentials can acces s the test accounts. The VA Au stin Infor mation Tec hnology Ce nter (AITC ) support team reset s password s and sets up new ac cess crede ntials on an as-need ed basis. | ||
| 82 | Installati on Process | ||
| 83 | As soon as the remed iation pro cess is co mplete and the patch is availa ble for te sting, a K IDS build is created in the De velopment account an d then sen t to FORUM for final packaging . The patc h is then submitted to the VA SQA Lead’s Mailman a ccount for installat ion. | ||
| 84 | An EPIP De veloper or Test Engi neer utili zes the KI DS Install ation proc ess to ext ract the b uild from the patch and instal l the buil d into a t est accoun t. The ind ividual wh o installs the patch verifies the routin e checksum s and also checks fo r errors d uring the installati on process . If the p atch is su ccessfully installed without a ny errors, then the EPIP Test team proce eds with F unctional, Regressio n, and Com ponent Int egration a nd System testing. I f defects are found, then the Developmen t team wor ks to find a resolut ion and cr eates new versions o f the patc h until al l defects are resolv ed. | ||
| 85 | Test Data | ||
| 86 | The SQA Te sting team utilizes the test d ata in the designate d test acc ounts (D1G 1, D1G2). | ||
| 87 | The test d ata is enc rypted fol lowing the standards set forth by the VA Office of Informati on & Techn ology (OI& T). All Pe rsonally I dentifiabl e Informat ion (PII) and Protec ted Health Informati on (PHI) i s scrubbed and is no t availabl e to the T est Engine ers. | ||
| 88 | All testin g is execu ted using encrypted test patie nts availa ble from a ny of the EPIP test accounts. Examples o f encrypte d test pat ients: | ||
| 89 | AAAHURMMX, XPHY | ||
| 90 | BADHB, HAA DXS | ||
| 91 | FDHUX, YHI J | ||
| 92 | All tests were execu ted manual ly by EPIP Test Engi neers. | ||
| 93 | Issues | ||
| 94 | No issues were encou ntered dur ing testin g of GMRC* 3.0*89. | ||
| 95 | Title | ||
| 96 | Issue Desc ription | ||
| 97 | Type | ||
| 98 | Severity | ||
| 99 | N/A | ||
| 100 | N/A | ||
| 101 | N/A | ||
| 102 | N/A | ||
| 103 | Test Execu tion Log | ||
| 104 | The Test E xecution L og records the execu tion of te st scripts and docum ents the t est result s for each test scri pt. | ||
| 105 | The SQA Te sting team utilizes the Ration al Quality Manager ( RQM) tool for all te sting acti vities. Al l test doc uments are stored in the EPIP repository , includin g the Mast er Test Pl an, Test S uites, Tes t Cases, a nd Test Sc ripts. Tes t executio n is perfo rmed, and test resul ts recorde d, in RQM. The Test Engineer a dds the te st results to the Te st Executi on records to indica te whether testing a chieved Pa ss or Fail status. | ||
| 106 | The Test E xecution r ecords for GMRC*3.0* 89 are inc luded in t he EPIP Pa tch GMRC*3 .0*89 Mast er Test Pl an. The Ma ster Test Plan is av ailable in Appendix A. | ||
| 107 | Test Defec t Log | ||
| 108 | The Test D efect Log is a tool for record ing, analy zing, trac king, and documentin g the clos ure of def ects. It s pecifies t he screen, field, be havior or result tha t occurred , and the IEEE-defin ed Severit y Level. I t includes enough in formation for the de veloper to find and re-create the defect . The Defe ct Log is available in Appendi x B. | ||
| 109 | Test Resul ts Summary | ||
| 110 | SQA testin g for this intake st arted in t he Dev1 Go ld1 test e nvironment on Februa ry 16, 201 7 and ende d on March 17, 2017. Test vers ion 1 was presented during the EPIP inte rnal demon stration a nd one (1) defect wa s noted at that time . The defe ct was det ermined to be relate d to the F ileMan app lication, to be reso lved with a FileMan patch. Thi s version was not fo rmally tes ted due to the defec t identifi ed during the demons tration an d was retu rned to De velopment for code m odificatio ns. | ||
| 111 | Test versi on 2 was s ubmitted t o SQA on F ebruary 16 , 2017. Th is version corrected the confi guration c heck logic . Test ver sion 2 was not forma lly tested , as Test version 3 was receiv ed soon af ter. | ||
| 112 | Test versi on 3 was i nstalled i n the Dev1 Gold1 test environme nt on Febr uary 20, 2 017 after Unit testi ng was com pleted in Dev1 Silve r1. This v ersion pro vided addi tional mod ifications to the co nfiguratio n check lo gic. Upon completion of Integr ation test ing (Compo nent Integ ration and System Te sting, Fun ctional Te sting, and Regressio n Testing) , one (1) defect was found and reported. | ||
| 113 | Test versi on 4 was i nstalled i n the Dev1 Gold1 tes t environm ent on Feb ruary 28, 2017 after Unit test ing was co mpleted in Dev1 Silv er1. This version in cluded upd ates to ad dress the Integratio n Registry Control n eeded for this patch . Upon com pletion of Integrati on testing (Componen t Integrat ion and Sy stem Testi ng, Functi onal Testi ng, and Re gression T esting), z ero (0) de fects were found and reported. | ||
| 114 | Test versi on 5 was i nstalled i n the Dev1 Gold1 tes t environm ent on Mar ch 8, 2017 after Uni t testing was comple ted in Dev 1 Silver1. The EPIP Developmen t team cre ated Test version 5 to add the FileMan p atches req uired to r esolve the defect fo und during the inter nal demo ( Test versi on 1). Upo n completi on of Inte gration te sting (Com ponent Int egration a nd System Testing, F unctional Testing, a nd Regress ion Testin g), zero ( 0) defects were foun d and repo rted. | ||
| 115 | Defect Sev erity and Priority L evels | ||
| 116 | A defect i s defined as a flaw in a compo nent or sy stem that can cause the compon ent or sys tem to fai l to perfo rm its req uired func tion, e.g. , an incor rect state ment or da ta definit ion. A def ect, if en countered during exe cution, ma y cause a failure of the compo nent or sy stem. | ||
| 117 | Defects ar e categori zed accord ing to sev erity and priority l evels. The test anal yst assign s the seve rity, whil e the deve lopment ma nager assi gns the pr iority for repair. F or more in formation, see Defec t Severity and Prior ity Defini tion in th is Test Ev aluation. | ||
| 118 | Total Defe cts by Sev erity Leve l | ||
| 119 | The Defect Log in Ap pendix B d isplays th e defects encountere d while te sting this patch, an d the seve rity level of each. | ||
| 120 | Breakdown of Test Re sults | ||
| 121 | Testing wa s complete d on March 17, 2017. All test results we re recorde d in RQM. Detailed r esults are available in the EP IP Patch G MRC*3.0*89 Master Te st Plan (s ee Appendi x A). | ||
| 122 | Performanc e Testing | ||
| 123 | Performanc e testing was not co nducted. | ||
| 124 | Test Cover age | ||
| 125 | The EPIP P atch GMRC* 3.0*89 Mas ter Test P lan contai ns details on test c overage (s ee Appendi x A). | ||
| 126 | Requiremen ts Covered | ||
| 127 | The requir ements for GMRC*3.0* 89 are sto red in the Rational Dynamic Ob ject Orien ted Requir ements Sys tem (DOORS ). The tes t cases us ed to vali date that the requir ements hav e been add ressed are stored in RQM and a re linked to the req uirements, providing full trac eability. The user s tories sto red in the Rational Change and Configura tion Manag ement (CCM ) applicat ion (a.k.a . Rational Team Conc ert (RTC)) are linke d to the r equirement s and test cases. | ||
| 128 | The follow ing links provide ac cess to th e various EPIP repos itories in the Ratio nal toolki t. | ||
| 129 | EPIP (RM) – Go to Ar tifacts, t hen Browse Artifacts , and then search fo r the desi red patch number. Th e patch fo lder conta ins the re quirements for that patch. | ||
| 130 | EPIP (QM) – Go to Pl anning, th en Browse Test Plans , and then search fo r the desi red Master Test Plan . The Mast er Test Pl an and tes t cases ar e linked t o requirem ents. | ||
| 131 | EPIP (CM) – Go to Pl ans, then All Plans, and then search for the desir ed sprint Plan. The user stori es in each Plan are linked to requiremen ts and tes t cases. | ||
| 132 | Section 50 8 Complian ce Coverag e | ||
| 133 | Section 50 8 testing was not re quired for this patc h. | ||
| 134 | Suggested Actions | ||
| 135 | Leidos rec ommends mo ving this patch to I OC testing . | ||
| 136 | Defect Sev erity and Priority D efinitions | ||
| 137 | The classi fication o f defects within a s ystem exam ines both the severi ty and pri ority of t he defect. | ||
| 138 | Severity i s a measur e of how g reat the i mpact is o n the user ’s ability to comple te the doc umented ac tions with in the sys tem. | ||
| 139 | Priority d etermines the speed with which a given d efect must be repair ed. | ||
| 140 | Defect cla ssificatio n may be d etermined either bec ause testi ng is dela yed by a f ailure in the system or becaus e a cumber some worka round prev ents a use r from com pleting th e assigned tasks. Bo th severit y and prio rity measu res must b e recorded when sche duling def ect resolu tion tasks . | ||
| 141 | Defect Sev erity Leve l | ||
| 142 | The follow ing subsec tions iden tify the d efect seve rity level s. | ||
| 143 | Severity L evel 1 – C ritical | ||
| 144 | Institute of Electri cal and El ectronics Engineers (IEEE) def inition: T he defect results in the failu re of the complete s oftware sy stem, of a subsystem , or of a software u nit (progr am or modu le) within the syste m. | ||
| 145 | Any defect that comp romises pa tient safe ty or syst em securit y. Example s of syste m security defects i nclude bre ach of con fidentiali ty require ments of t he Privacy Act, the Health Ins urance Por tability a nd Account ability Ac t (HIPAA), or Federa l Tax Info rmation gu idelines. | ||
| 146 | Loss of sy stem funct ionality c ritical to user oper ations wit h no suita ble workar ound, i.e. , there is no way to achieve t he expecte d results using the applicatio n. | ||
| 147 | System cra sh or hang that prev ents furth er testing or operat ion of the complete applicatio n or a sec tion of th e applicat ion. | ||
| 148 | Any defect that caus es corrupt ion of dat a from a r esult of t he system (as oppose d to user error). | ||
| 149 | Any defect in which inappropri ate transm issions ar e consiste ntly gener ated or ap propriate transmissi ons of HL7 messages fail to be generated . | ||
| 150 | Loss of fu nctionalit y resultin g in erron eous eligi bility/enr ollment de terminatio ns or comm unications not being sent. | ||
| 151 | Severity L evel 2 - H igh | ||
| 152 | IEEE defin ition: The defect re sults in t he failure of the co mplete sof tware syst em, of a s ubsystem, or of a so ftware uni t (program or module ) within t he system. There is no way to make the f ailed comp onent(s) f unction. H owever, th ere are ac ceptable p rocessing alternativ es which w ill yield the desire d result. | ||
| 153 | A major de fect in th e function ality that does not result in corruption of data. | ||
| 154 | A major de fect in th e function ality resu lting in a failure o f all or p art of the applicati on, where: | ||
| 155 | The expect ed results can tempo rarily be achieved b y alternat e means. T he custome r indicate s the work around is acceptabl e for the short term . | ||
| 156 | Any defect that does not confo rm to Sect ion 508 st andards. | ||
| 157 | Any defect that resu lts in ina ccurate or missing r equirement s. | ||
| 158 | Any defect that resu lts in inv alid authe ntication or authent ication of an invali d end user . | ||
| 159 | Severity L evel 3 - M edium | ||
| 160 | IEEE defin ition: The defect do es not res ult in a f ailure, bu t causes t he system to produce incorrect , incomple te, or inc onsistent results, o r the defe ct impairs the syste ms usabili ty. | ||
| 161 | Minor func tionality is not wor king as in tended and a workaro und exists but is no t suitable for long term use | ||
| 162 | The inabil ity of a v alid user to access the system consisten t with gra nted privi leges | ||
| 163 | Typographi cal or gra mmatical e rrors in t he applica tion, incl uding inst allation g uides, use r guides, training m anuals, an d design d ocuments | ||
| 164 | Any defect producing cryptic, incorrect, or inappr opriate er ror messag es | ||
| 165 | Any defect that resu lts from t he use of non-standa rd data te rminology in the app lication o r document ation, as defined by the Depar tment of V eterans Af fairs | ||
| 166 | Cosmetic i ssues that are impor tant to th e integrit y of the p roduct, bu t do not r esult in d ata entry and or dat a quality problems. | ||
| 167 | Severity L evel 4 - L ow | ||
| 168 | IEEE defin ition: The defect do es not cau se a failu re, does n ot impair usability, and the d esired pro cessing re sults are easily obt ained by w orking aro und the de fect. | ||
| 169 | Minor loss of, or de fect in th e function ality wher e a long t erm use ex ists | ||
| 170 | Low-level cosmetic i ssues. | ||
| 171 | Priority C lassificat ions | ||
| 172 | The follow ing subsec tions iden tify the a ppropriate actions f or defects at each p riority le vel, per d efinitions of IEEE. | ||
| 173 | Priority 1 - Resolve Immediate ly | ||
| 174 | Further de velopment and/or tes ting canno t occur un til the de fect has b een repair ed. The sy stem canno t be used until the repair has been affe cted. | ||
| 175 | Priority 2 - Give Hi gh Attenti on | ||
| 176 | The defect must be r esolved as soon as p ossible be cause it i s impairin g developm ent and/or testing a ctivities. System us e will be severely a ffected un til the de fect is fi xed. | ||
| 177 | Priority 3 - Normal Queue | ||
| 178 | The defect should be resolved in the nor mal course of develo pment acti vities. It can wait until a ne w build or version i s created. | ||
| 179 | Priority 4 - Low Pri ority | ||
| 180 | The defect is an irr itant that should be repaired, but can b e repaired after mor e serious defects ha ve been fi xed. | ||
| 181 | Optional T ables, Cha rts, and G raphs | ||
| 182 | None. | ||
| 183 | Document A pproval Si gnatures | ||
| 184 | |||
| 185 | Signed: __ __________ __________ __________ __________ __________ __________ _________ | ||
| 186 | Program/Pr oject Mana gerDate | ||
| 187 | |||
| 188 | Signed: __ __________ __________ __________ __________ __________ __________ _________ | ||
| 189 | Business S ponsor Rep resentativ eDate | ||
| 190 | |||
| 191 | Signed: __ __________ __________ __________ __________ __________ __________ _________ | ||
| 192 | Test LeadD ate | ||
| 193 | |||
| 194 | Appendix A - Test Ex ecution Lo g | ||
| 195 | The Test E xecution R ecords for GMRC*3.0* 89 are inc luded in t he EPIP Pa tch GMRC*3 .0*89 Mast er Test Pl an. | ||
| 196 | |||
| 197 | |||
| 198 | Appendix B – Defect Log | ||
| 199 | Two (2) de fects were found dur ing testin g of GMRC* 3.0*89. Al l defects have been resolved. | ||
| 200 | Note: Test version 2 is not in cluded in this table since it was not te sted. | ||
| 201 | Defect ID | ||
| 202 | Affected S creen | ||
| 203 | Affected F ield | ||
| 204 | Observed B ehavior | ||
| 205 | Severity | ||
| 206 | Descriptio n | ||
| 207 | 480615 | ||
| 208 | Consult Cl osure for Patient In fo is disp laying on a separate page | ||
| 209 | Consult Cl osure Scre en in Vist A | ||
| 210 | Potential Patient Sa fety issue | ||
| 211 | High | ||
| 212 | One (1) de fect was i dentified during the EPIP inte rnal demon stration f or patch G MRC*3.0*89 . | ||
| 213 | *This was identified in Test v ersion 1.0 . | ||
| 214 | N/A | ||
| 215 | N/A | ||
| 216 | N/A | ||
| 217 | N/A | ||
| 218 | N/A | ||
| 219 | No defects were foun d during U nit Testin g of versi on 3.0. | ||
| 220 | N/A | ||
| 221 | N/A | ||
| 222 | N/A | ||
| 223 | N/A | ||
| 224 | N/A | ||
| 225 | No defects were foun d during C omponent I ntegration /Systems T esting of version 3. 0. | ||
| 226 | N/A | ||
| 227 | N/A | ||
| 228 | N/A | ||
| 229 | N/A | ||
| 230 | N/A | ||
| 231 | No defects were foun d during R egression Testing of version 3 .0. | ||
| 232 | 477206 | ||
| 233 | Consult Cl osure Brow ser area s hortened b y 2 lines in Screen display | ||
| 234 | Consult Cl osure Scre en in Vist A | ||
| 235 | N/A | ||
| 236 | Medium | ||
| 237 | One (1) de fect was f ound durin g Function al Testing of versio n 3.0. | ||
| 238 | N/A | ||
| 239 | N/A | ||
| 240 | N/A | ||
| 241 | N/A | ||
| 242 | N/A | ||
| 243 | No defects were foun d during U nit Testin g of versi on 4.0. | ||
| 244 | *Test vers ion 4 was created to address t he updates to the IC Rs require d for this patch. | ||
| 245 | N/A | ||
| 246 | N/A | ||
| 247 | N/A | ||
| 248 | N/A | ||
| 249 | N/A | ||
| 250 | No defects were foun d during C omponent I ntegration /Systems T esting of version 4. 0. | ||
| 251 | N/A | ||
| 252 | N/A | ||
| 253 | N/A | ||
| 254 | N/A | ||
| 255 | N/A | ||
| 256 | No defects were foun d during R egression Testing of version 4 .0. | ||
| 257 | N/A | ||
| 258 | N/A | ||
| 259 | N/A | ||
| 260 | N/A | ||
| 261 | N/A | ||
| 262 | No defects were foun d during F unctional Testing of version 4 .0. | ||
| 263 | N/A | ||
| 264 | N/A | ||
| 265 | N/A | ||
| 266 | N/A | ||
| 267 | N/A | ||
| 268 | No defects were foun d during U nit Testin g of versi on 5.0. | ||
| 269 | *Test Vers ion 5.0 wa s created to include the code needed for the FileM an patch u pdates. | ||
| 270 | N/A | ||
| 271 | N/A | ||
| 272 | N/A | ||
| 273 | N/A | ||
| 274 | N/A | ||
| 275 | No defects were foun d during C omponent I ntegration /Systems T esting of version 5. 0. | ||
| 276 | N/A | ||
| 277 | N/A | ||
| 278 | N/A | ||
| 279 | N/A | ||
| 280 | N/A | ||
| 281 | No defects were foun d during R egression Testing of version 5 .0. | ||
| 282 | N/A | ||
| 283 | N/A | ||
| 284 | N/A | ||
| 285 | N/A | ||
| 286 | N/A | ||
| 287 | No defects were foun d during F unctional Testing of version 5 .0. |
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